Raman microanalysis has emerged as a crucial instrument in the forensic evaluation of documents. Historically, the prevalent issue of fluorescence interference limited Raman’s applicability in document analysis. However, with the latest advancements in techniques to eliminate fluorescence and the rise of SERS Raman as an efficient approach to suppress fluorescence while amplifying the Raman signal, there’s anticipated growth in this research domain.
Both FT-IR and Raman microscopy are potent tools in identifying instances of document tampering and forgery.