Characterization of Silicon

Characterization of Silicon

Bruker Optics delivers leading-edge FTIR spectrometer technology for dependable, non-invasive Silicon quality assessment, catering to both photovoltaics and electronics. Take advantage of over three decades of proficiency in semiconductor analysis based on infrared technology. Bruker Optics’ FTIR and RAMAN spectrometers stand out as comprehensive tools for diverse material explorations.

FTIR Techniques for Silicon Quality Evaluation:

• CryoSAS: Industrial standards for Silicon quality control
• Analysis of carbon and oxygen concentrations at ambient conditions
• Low-temperature evaluation of shallow contaminants, including boron and phosphorous, through transmittance and photoluminescence (PL)
• Adherence to SEMI, ASTM, and DIN specifications
• Utilizing Raman spectroscopy provides an optimal approach to determining the crystalline versus amorphous ratio in thin-film solar cells. The proportion of the microcrystalline phase directly correlates to the cell’s electrical attributes and, by extension, its quality. Raman microscopy has proven its capability in detecting minute variations in crystallinity. Given its speedy, contact-free data gathering, Raman spectroscopy is ideally suited for seamless integration into processing lines.