Analysis of Ultra-Fine Layers

Analysis of Ultra-Fine Layers

When examining ultra-fine layers on silicon wafers, the attenuated total reflection (ATR) technique amplifies the sensitivity to the specific layer, making it particularly beneficial for research and developmental pursuits. BRUKER presents an expansive selection of specialized tools tailored for such analyses. This ensures the capability to detect even monolayers. Furthermore, FTIR microscopy can visualize the spatial distribution of these layers.

For guidance on the optimal instrument tailored to your analytical needs, please feel free to reach out to us.